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IBM is looking to hire an overlay metrology engineer to join our team in the fast paced, exciting environment of semiconductor research R&D. The candidate will be working closely with other metrology engineers, process owners, and integration to deliver metrology solutions for advanced semiconductor technology.
Responsibilities in this role include:
- Analysis of overlay KPIs, daily readouts of overlay performance, and weekly reports on improvement plans
- Overlay metrology line support for day to day operations addressing spec over fails, measurement fails, etc.
- Continuous improvement of overlay measurement robustness and precision. Assisting technician team on overlay recipe creation for complex structures
- Development and optimization of overlay target designs for Image Based Overlay, SEM based overlay, and Diffraction Based Overlay techniques
- This role will also involve interaction with equipment vendors to evaluate new tool capabilities and identify areas for collaboration and overlay optimization
